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International Society of Science and Applied Technologies |
| Software Defect Discovery and Resolution Modeling | ||||
| Author | Maskura Nafreen
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| Co-Author(s) | Melanie Luperon; Lance Fiondella; Vidhyashree Nagaraju; Ying Shi; Thierry Wandji
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| Abstract | Traditional software reliability growth models only consider defect discovery data, yet the practical concern of software engineers is the removal of these defects. Most attempts to model the relationship between defect discovery and resolution have been restricted to differential equation-based models associated with these two activities. However, defect tracking databases offer a practical source of information on the defect lifecycle suitable for more complete reliability and performance models. This paper explicitly connects software reliability growth models to software defect tracking. Data from a NASA project was employed to develop differential equation-based models of defect discovery and resolution as well as a distributional model of defect resolution. Illustrations compare the predictive and computational performance of alternative approaches. The results suggest that the simple distributional approach achieves the best tradeoff between these two performance measures.
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| Keywords | Software reliability, software reliability growth model, software defect lifecycle, defect resolution | |||
| Article #: RQD26-251 | ||||
Proceedings of 26th ISSAT International Conference on Reliability & Quality in Design |