A Method of Optimization Selecting Test Points by Inverse Process  
Author Wenkui Hou


Co-Author(s) Zhiming Zhang


Abstract With the complexity of the structure of electronic products, testability design has been widely concerned. In the testability design, the selection of test points is an important part of the testability design. Based on the in-depth study of selecting of test points, a method of test points optimization based on D matrix analysis by inverse process is proposed. In this method, the relationship between the number of isolated faults and the number of test points and the correlation matrix of fault and testability is deduced, inverse process selection method is proposed. The usability of the method is proved by comparing with the application of other intelligent algorithm at the test point selection.


Keywords Testability design, test points optimization, fault and test correlation matrix, inverse process
    Article #:  23-323
Proceedings of the 23rd ISSAT International Conference on Reliability and Quality in Design
August 3-5, 2017 - Chicago, Illinois, U.S.A.