A Bivariate Degradation Model for Sequence-Dependent Stress Testing  
Author Jingbo Guo


Co-Author(s) E. A. Elsayed


Abstract Step-stress accelerated life/degradation testing is widely used in reliability estimation for highly reliable products. However it is limited since the reliability prediction model does not consider the effect of stress sequence in field environment. In this paper, we propose a sequence-dependent stress degradation model that considers the effect of stress sequence on the unit’s degradation. We also consider dependent multiple degradation processes modeled as a multivariate degradation path. Approaches for the parameters’ estimation of the reliability model are investigated and reliability metrics such as time-to-failure and mean residual life are obtained.


Keywords Bivariate degradation paths, Sequence-dependent stress, Reliability estimation
    Article #:  21277
Proceedings of the 21st ISSAT International Conference on Reliability and Quality in Design
August 6-8, 2015 - Philadelphia, Pennsylvia, U.S.A.