Optimal Design of Degradation Tests for Reliability Demonstration  
Author Guangbin Yang

 
Co-Author(s)

 
Abstract This paper presents optimal reliability demonstration test plans for the products whose performance characteristics can be modeled with the Weibull distribution. In particular, the paper describes degradation models, test method, test termination rules, and the calculation of the reliability and confidence interval from degradation data. The paper delineates test plan models, which are solved for optimal sample size and test time. The test plans results in the lowest test cost and the shortest test time for the products that are expected to pass or fail the test at a high degree of confidence. An application example is presented to illustrate the proposed method, and shows a large reduction in test cost.

 
Keywords Degradation test; optimal test plan; reliability demonstration; sample size; test cost; test time
   
    Article #:  1865
 
Proceedings of the 18th ISSAT International Conference on Reliability and Quality in Design
July 26-28, 2012 - Boston, Massachusetts, U.S.A.