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International Society of Science and Applied Technologies |
| Reliability Analysis of New Parallel Systems with x Units | ||||
| Author | Toshio Nakagawa
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| Co-Author(s) | Satoshi Mizutani
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| Abstract | A parallel system is the most fundamental redundant system because multiple identical units are working concurrently to perform successfully an objective work. As one extended system, we define newly a parallel system with x (0 < x < ∞) units, and obtain its reliability measures such as MTTF, median and failure rate. In particular, we have an interesting result that the failure rate moves strangely to decrease initially, and after that, to increase strictly for a given x (0 < x < 1). Furthermore, we apply this definition to series-parallel and parallel-series systems, and derive similar interesting results. It would be newly adapted to move uncertain and complex systems as information and technologies have rapidly developed.
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| Keywords | Redundant system, x units, reliability measure, parallel system, series system | |||
| Article #: RQD2024-32 | ||||
Proceedings of 29th ISSAT International Conference on Reliability & Quality in Design |