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International Society of Science and Applied Technologies |
| An Improved Two-Stage Partial Inspection Strategy for Lot Determination Based on Process Yield | ||||
| Author | Shih-Wen Liu
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| Co-Author(s) | Chien-Wei Wu
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| Abstract | Skip-Lot Sampling Plans (SkSP) reduce inspection costs while maintaining quality in continuous production. The SkSP-2L.1 method, a two-level skip-lot sampling plan, enhances flexibility by using two inspection rates based on quality history. This paper integrates SkSP-2L.1 with the Process yield index, a key metric for process and product quality evaluation. Starting with normal inspection, SkSP-2L.1 transitions to higher skip levels upon consecutive acceptances, introducing a second, more relaxed inspection rate for consistently high quality. Using a Markov chain framework, we derive the operating characteristic function and average sample number for the integrated SkSP-2L.1 plan. Parameters are optimized by solving a minimization problem considering acceptable risks and quality levels. Results show our method significantly improves the efficiency and reliability of SkSP- 2L.1, offering a cost-effective solution for lot sentencing in high-quality production environments.
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| Keywords | Skip-Lot inspection, SkSP-2L.1, process yield index, operating characteristic function, quality control, lot sentencing | |||
| Article #: RQD2024-169 | ||||
Proceedings of 29th ISSAT International Conference on Reliability & Quality in Design |