Reliability Modeling for k-out-of-n Surveillance Systems Subject to Two Stochastic Processes  
Author Yao Zhang

 
Co-Author(s) Hoang Pham

 
Abstract In this paper, we develop a two stochastic-process reliability model of k -out-of-n surveillance systems with two competing failure modes such as detectable mode and undetectable mode. The reliability of the system is derived with considerations of the intrusion process and a (m, T) opportunistic maintenance policy. Several numerical examples are given to demonstrate the validity of the modeling and the sensitivity of important parameters.

 
Keywords Surveillance model, reliability, multiple processes, multi-state component, opportunistic maintenance
   
    Article #:  19222
 
Proceedings of the 19th ISSAT International Conference on Reliability and Quality in Design
August 5-7, 2013 - Honolulu, Hawaii, U.S.A.