Equivalent Accelerated Degradation Test Plans for a Nonlinear Random Coefficients Models  
Author Seong-joon Kim

 
Co-Author(s) Suk Joo Bae

 
Abstract Design of optimal Accelerated Degradation Testing (ADT) plan has been extensively researched over several decades. However, experimenters can often face the situation that the optimal plan is not feasible due to limited resources, even after taking into account the design factors in the planning phase. Therefore, designing a test plan that is equivalent to the target plan using an different stress-loading or a testing condition is needed. However, there exists currently little work in the development of equivalent ADT plan. In this paper, we propose an equivalent cost-effective accelerated degradation test (ADT) plan in the context of a nonlinear random-coefficients model. The proposed method is applied to a well-known constant-stress ADT problem in the literature. The definition and formula used in this paper can applied through a wide range of types of equivalent ADT plans.

 
Keywords Accelerated Degradation Test Plan, Equivalency, Nonlinear random-coefficients model, Fisher information matrix, Reliability
   
    Article #:  19181
 
Proceedings of the 19th ISSAT International Conference on Reliability and Quality in Design
August 5-7, 2013 - Honolulu, Hawaii, U.S.A.