Probabilistic Specimen Property-Fatigue Life Mapping and P-S-N Curve Fitting  
Author Liyang Xie

 
Co-Author(s) Jianzhong Liu

 
Abstract Based on probabilistic mapping from the probability distribution of specimen property to that of fatigue life, this paper presents a small-size sample based P-S-N curve fitting method. Equivalent fatigue life date can be obtained according to the mapping principle. The basic viewpoint is that the fatigue lives tested at any cyclic stress levels can be equivalently converted to another arbitrary baseline stress level according to the life distribution – stress relationship. Test results illustrate that the P-S-N curves obtained by such methods with 30, 24 or 20 samples, respectively, are close to those obtained by the conventional test method with 60 or 40 samples.

 
Keywords P-S-N curve fitting, property-life mapping, equivalent life, information fusion
   
    Article #:  19174
 
Proceedings of the 19th ISSAT International Conference on Reliability and Quality in Design
August 5-7, 2013 - Honolulu, Hawaii, U.S.A.